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Tomoe Engineering sells the nanometer failure analysis system for WDM equipment parts
2001/05/21
Tomoe Engineering sells the nanometer failure analysis system for WDM equipment parts
Tomoe Engineering launches the system that analyzes defects of WDM (wavelength division multiplex) equipment parts. We modified the system invented by Nanonics Imaging Limited, Israeli venture company, to apply it to defects analysis of the WDM equipment parts. This system, when it is connected to the optical microscope, detects cracks and sample surfaces in nanometer (one-billionths of a meter) detail. We promote sales the systems to the R & D laboratories of the manufacturers who produce WDM equipment parts that easily receive fine damages.
NSOM-100/200 is a name of this system. It consists of a measuring head, a light detector and a control box. An optical fiber tip detects a reflection ratio, color and a light energy. It can accurately analyze fine defects even on the 50 nanometer part. A standard price is 25 million yen for one set. We plan 500 million yen sales in 2002.
We obtained sole distributorship of the fine material analyzing system from Nanonics in 1998 and started sale mainly to R & D institutes such as the engineering department of Tokyo University. Since demand for WDM equipment parts, such as the light switch and micro lens, has increased, we modified the system to analyze defects of these products.