NSOM/AFM confocal microscope system
NSOM/AFM Full Integration System
Description
The AFM/NSOM full integration system accomplished high-resolution 3-D imaging and optical microscopy.
Features
The Nanonics system can be easily integrated into a range of existing "host" microscopy systems with help of the ultra thin 3-D flatscanner or the cantilevered scanning probe. Two types are available; the sample-scanning NSOM-100 and the probe sample-scanning NSOM-2000.
The low temperature module, liquid cell and RAMAN microscopy are available as options.
The low temperature module, liquid cell and RAMAN microscopy are available as options.
Related Website
Inquiry
| Advanced Materials Dept. | 12F Art-Village Osaki Centraltower, 1-2-2 Osaki, Shinagawa-ku, Tokyo 141-0032 TEL:(3)5435-6515 FAX:(3)5435-0071 |