Tomoe Engineering Co., Ltd.

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  4. NSOM/AFM confocal microscope system

NSOM/AFM confocal microscope system


NSOM/AFM Full Integration System


The AFM/NSOM full integration system accomplished high-resolution 3-D imaging and optical microscopy.


The Nanonics system can be easily integrated into a range of existing "host" microscopy systems with help of the ultra thin 3-D flatscanner or the cantilevered scanning probe. Two types are available; the sample-scanning NSOM-100 and the probe sample-scanning NSOM-2000.
The low temperature module, liquid cell and RAMAN microscopy are available as options.

Related Website

Nanonics Imaging


Advanced Materials Dept.
19F Osaki Bright Core,
5-15, Kitashinagawa 5-chome, Shinagawa-ku, Tokyo 141-0001, Japan
TEL:(3)3442-5142 FAX:(3)3442-5175

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