NSOM/AFM confocal microscope system
NSOM/AFM Full Integration System
DescriptionThe AFM/NSOM full integration system accomplished high-resolution 3-D imaging and optical microscopy.
FeaturesThe Nanonics system can be easily integrated into a range of existing "host" microscopy systems with help of the ultra thin 3-D flatscanner or the cantilevered scanning probe. Two types are available; the sample-scanning NSOM-100 and the probe sample-scanning NSOM-2000.
The low temperature module, liquid cell and RAMAN microscopy are available as options.
URL : http://www.nanonicsimaging.com
Advanced Materials Dept.
19F Osaki Bright Core,
5-15, Kitashinagawa 5-chome, Shinagawa-ku, Tokyo 141-0001, Japan